IDDA28931378
Data05 Octombrie 2021
ValoareStareOferta acceptata
Autoritatea contractantaLocalitateMagurele, Ilfov
FurnizorTipul contractuluiFurnizare
Cod CPVDescriere:Autoritatea contractanta doreste sa achizitioneze „Consumabile din siliciu pentru AFM" in conformitate cu cerintele si conditiile din caietul de sarcini atasat.
Prin acceptarea achizitiei se consideră acceptate cerințele din caietul de sarcini atasat.
Persoana contact Compartiment Achizitii Publice: Viorica Baicu
Persoana contact Compartiment tehnic-Laborator tinte: Cristina Gheorghiu
Achizitii1.880,54 RON
Cantitate: 1
Unitate masura: bucata
Varfuri contact/ semicontact
AFM Contact probes with PtIr conductive coating
Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4x1.6x0.3mm
Reflective side PtIr
Conductive coating PtIr (25nm), Cr adhesion layer (25A)
Cantilever number 1 rectangular
Tip curvature radius ~ 35nm
Available CSG01 probe bare, tipless, with Al reflective coating1.880,54 RON
Cantitate: 1
Unitate masura: bucata
Varfuri contact
AFM Contact probes with PtIr conductive coating
Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4x1.6x0.3mm
Reflective side PtIr
Conductive coating PtIr (25nm), Cr adhesion layer (25A)
Cantilever number 1 rectangular
Tip curvature radius ~ 35nm
Also available coatings conductive TiN, AuAvailable CSG01 probe bare, tipless, with Al reflective coating4.107,5 RON
Cantitate: 1
Unitate masura: bucata
Varfuri piramidale
AFM TOP VISUAL Probes
Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4x1.6x0.3mm
Reflective side coating Pt
Front coating Pt
Cantilever number 1 rectangular
Tip curvature radius 25 - 35 nm
Tip shape Pyramidal
Tip height 14-16 um1.781,57 RON
Cantitate: 1
Unitate masura: bucata
Varfuri pentru modularea fortei
AFM Force modulation Probes with PtIr conductive coating
Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4x1.6x0.3mm
Reflective side PtIr
Conductive coating PtIr (25nm), Cr adhesion layer (25A)
Cantilever number 1 rectangular
Tip curvature radius ~ 35nm
Also available coatings conductive TiN, Au;
magnetic CoCrAvailable FMG01 probe bare, tipless, with Al reflective coating2.969,28 RON
Cantitate: 1
Unitate masura: bucata
Varfuri super ascutite pentru modularea fortei
Super Sharp AFM probes
Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4x1.6x0.3mm
Reflective side Al
Cantilever number 1 rectangular
Tip curvature radius typical 2nm, guaranteed < 5nm2.226,96 RON
Cantitate: 1
Unitate masura: bucata
Varfuri de diamant monocristal precis
AFM Single crystal diamond cantilevers
Cantilever length, L�5�m Cantilever width, W�3�m Cantilever thickness, �m Resonant frequency, kHz Force constant, N/m SCD tip length, �m
min typical max min typical max min typical max min typical max
noncontact 125 40 4.5 4.0 4.5 240 320 440 22 40 100 12 14 162.226,96 RON
Cantitate: 1
Unitate masura: bucata
Varfuri de diamant monocristal
AFM Single crystal diamond cantilevers
Cantilever length, L�5�m Cantilever width, W�3�m Cantilever thickness, �m Resonant frequency, kHz Force constant, N/m SCD tip length, �m
min typical max min typical max min typical max min typical max
noncontact 225 32 2.0 2.5 3.0 40 60 96 1 3 5 12 14 161.979,52 RON
Cantitate: 1
Unitate masura: bucata
Varfuri Whisker 10 grade
AFM Noncontact/Semicontact "Whisker Type" probes
Material carbin (carbon modification)
Aspect ratio better than 10:1
Angle j <= 10�
Curvature radius of
uncoated tip
typical 10 nm
?ngle of inclination a* 10��1�4.825,08 RON
Cantitate: 1
Unitate masura: bucata
Varfuri magnetice coercivitate ridicata
AFM Magnetic Probes
Standard chip size: 1.6x3.4x0.3 mm compatible with the most of commercial AFM devices.
The base silicon is highly doped to avoid electrostatic charges.
High reflective Al back side coating.
Tip side is coated with Co-based high coercitivity alloy with additional layers protecting from oxidation.
Total coating thickness � 60 nm.
Typical curvature radius of the tip is about 75 nm.
Guaranteed cantilever lifetime is 6 months if it�s storaged at the normal conditions (humidity 30-40%).2.127,98 RON
Cantitate: 1
Unitate masura: bucata
Varfuri noncontact TiN
AFM Noncontact probes with TiN conductive coating
Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4x1.6x0.3mm
Reflective side Au
Tip side TiN
Cantilever number 1 rectangular
Tip curvature radius 25 - 35 nm
Available probe bare, tipless, with Al reflective coating1.880,54 RON
Cantitate: 1
Unitate masura: bucata
Varfuri noncontact/ semicontact PtIr
AFM Noncontact probes with PtIr conductive coating
Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4x1.6x0.3mm
Reflective side PtIr
Conductive coating PtIr (25nm), Cr adhesion layer (25A)
Cantilever number 1 rectangular
Tip curvature radius ~ 35nm
Also available coatings conductive TiN, AuAvailable NSG03 probe bare, tipless, with Al reflective coating3.899,7 RON
Cantitate: 1
Unitate masura: bucata
Varfuri super ascutite
Super Sharp AFM probes
DLC tip specification:
Material � diamond-like carbon
Curvature radius - 1-3 nm.
Working length - >20 nm
Probe Specification:
Chip size � 3,6x1,6x0,4mm^3
Reflective side coating � Au
Chip has one rectangular cantilever2.127,98 RON
Cantitate: 1
Unitate masura: bucata
Varfuri noncontact rezolutie mare
AFM Noncontact probes with TiN conductive coating
Material Single Crystal Silicon, N-type, 0.01-0.025 Ohm-cm, Antimony doped
Chip size 3.4x1.6x0.3mm
Reflective side Au
Conductive coating TiN (25nm)
Cantilever number 1 rectangular
Tip curvature radius ~ 35nm
Also available coatings conductive PtIr, AuAvailable NSG10 probe bare, tipless, with Al reflective coating10.392,48 RON
Cantitate: 1
Unitate masura: bucata
Set standarde calibrare
Cantilever set
Set of calibration standards for SPM lateral and vertical calibration (submicron and simultaneuos calibration in X, Y and Z directions).
The set includes: 7 calibration gratings: - TGZ1, TGZ2, TGZ3, TGX1, TGG1, TGT1, TGQ1.
Contine 2 seturi complete.
TGZ1 step height: 20,0±2 nm*
TGZ2 step height: 110±10 nm*
TGZ3 step height: 520±20 nm*
TGX1 edge curvature radius less than 10nm
TGG1 edge angle 700, edge radius ≤10nm
TGT1 tip angle 50±10 degrees (on the very tip end), diagonal period 2,12µm
TGQ1 height 20nm ±1,5 nm*6.829,34 RON
Cantitate: 1
Unitate masura: bucata
Varfuri magnetice
AFM Magnetic Probes
Standard chip size: 3.6 ? 1.6 ? 0.4 mm, - makes cantilevers compatible with most of commercial AFMs.
Cantilever's material, silicon, is highly doped preventing from static charges' collection.
Reflective side is covered by Al layer, enhancing registration signal.
Tip side is covered by CoFe magnetic material with an additional layer that prevents from oxidation.
Thickness of magnetic layer is around 30-40 nm.
Average curvature radius is 35 nm.3.107,85 RON
Cantitate: 1
Unitate masura: bucata
Varfuri rezolutie mare
Cantilever set
10 x Standard chip size: 1.6x3.4x0.3 mm compatible with the most of commercial AFM devices.
The base silicon is highly doped to avoid electrostatic charges.
High reflective Al back side coating.
Tip side is coated with CoCr magnetic coating with additional layers protecting from oxidation
Total coating thickness � 30-40 nm*.
Typical curvature radius of the tip is about 40 nm.
Guaranteed cantilever lifetime is 1 year if it�s storaged at the normal conditions (humidity 30-40%)
5 x Standard chip size: 1.6x3.4x0.3 mm compatible with the most of commercial AFM devices.
The base silicon is highly doped to avoid electrostatic charges.
High reflective Al back side coating.
Tip side is coated with CoCr magnetic coating with additional layers protecting from oxidation
Total coating thickness � 15-20 nm*.
Typical curvature radius of the tip is about 25-30 nm.
Guaranteed cantilever lifetime is 1 year if it�s storaged at the normal conditions (humidity 30-40%).1.979,52 RON
Cantitate: 1
Unitate masura: bucata
Varfuri Whisker 20 grade
AFM Noncontact/Semicontact "Whisker Type" probes
Material carbin (carbon modification)
Aspect ratio better than 10:1
Angle j <= 10�
Curvature radius of:
uncoated tip
magnetic Co coated tip
typical 10 nm
typical 20 nm
?ngle of inclination a* 20��1�